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Dr Megan Hill

Dr Megan  Hill

Herchel Smith Fellow


I obtained my PhD in 2020 from Northwestern University, working under
Lincoln Lauhon in the Materials Science and Engineering department. My
PhD focused on the characterization of III-V nanowires as optical
interconnects. In this work we took a correlative, tomographic approach
to nanowire characterization, using multiple highly spatially resolved
techniques to deconvolve the effects of strain, structure, and
composition on nanowire emission. Before my PhD I received my Bachelor's
in Materials Science and Engineering at Cornell University. 

My research interests involve the use of synchrotron-based X-ray imaging
to characterize functional materials. During my postdoc at Cambridge, I
hope to investigate novel memristor devices in-operando using
synchrotron spectroscopy in order to better understand the resistive
switching mechanisms and how to optimize doping and crystal structure. 

My expertise is in coherent X-ray strain imaging and the use of
nano-focused X-ray beams for characterizing nanomaterials. I also have
extensive experience in composition mapping via atom probe tomography (a
time-of-flight mass spectrometry technique). 

Key Publications

M. O. Hill,  I. Calvo-Almazan, M. Allain, M. V. Holt, A. Ulvestad, J.
Treu, G. Koblmüller, C. Huang, X. Huang, H. Yan, E. Nazaretski, Y. S.
Chu, G. B. Stephenson, V. Chamard, L. J. Lauhon, and S. O.
Hruszkewycz. "Measuring three-dimensional strain and structural defects
in a single InGaAs nanowire using coherent X-ray multiangle Bragg
projection ptychography." Nano Letters 18.2 (2018): 811-819.   
J. Lähnemann*, M. O. Hill*, J. Herranz, O. Marquardt, G. Gao, A. A.
Hassan, A. Davtyan, S. O. Hruszkewycz, M. V. Holt, C. Huang, I.
Calvo-Almazán, U. Jahn, U. Pietsch, L. J. Lauhon, L.
Geelhaar. "Correlated Nanoscale Analysis of the Emission from Wurtzite
versus Zincblende (In, Ga) As/GaAs Nanowire Core–Shell Quantum
Wells." Nano Letters 19.7 (2019): 4448-4457.


J. Becker, M. O. Hill, M. Sonner, J. Treu, M. Döblinger, A. Hirler, H.
Riedl, J. J. Finley, L. J. Lauhon, G. Koblmüller. "Correlated Chemical
and Electrically Active Dopant Analysis in Catalyst-Free Si-Doped InAs
Nanowires." ACS Nano 12.2 (2018): 1603-1610.