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Fig. 1b. cross sectional TEM image showing complex defect microstructure in YBCO film with Ta and Nb-based double perovskite pinning additions. These unique pinning centres enable high field properties to be achieved. TEM image is courtesy of Wang TEM gro

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Fig. 1b. cross sectional TEM image showing complex defect microstructure in YBCO film with Ta and Nb-based double perovskite pinning additions. These unique pinning centres enable high field properties to be achieved. TEM image is courtesy of Wang TEM gro

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theme suupercon fig1b